nanoparticles
The AFM test is most ordinarily a sharp silicon nitrate or silicon tip on a free-moving cantilever that is mounted on a conveying chip. Cantilevers are slight arms of silicon nitrate or silicon with a rectangular or triangular shape and have well-characterized mechanical properties. The tip has a span in the nanometer go and is an exceptionally sharp projection toward the finish of the cantilever. Powers between the tip and the example influence an avoidance of the cantilever as indicated by Hooke's law when the cantilever-mounted tip is carried into nearness with an example surface by the AFM.
https://www.nanotrun.com/